Upper Clopper-Pearson Confidence Limits for Burn-in Studies under Additional Available Information
Upper Clopper-Pearson Confidence Limits For Burn-in Studies under Addi...
Upper Clopper-Pearson confidence limits for area scaling with differen...
Upper Clopper-Pearson confidence limits for area scaling with differen...
Separate area scaling for upper Clopper-Pearson confidence limits with...
Separate area scaling for upper Clopper-Pearson confidence limits
Upper Clopper-Pearson confidence limits under chip synergies and count...
Upper Clopper-Pearson confidence limits under chip synergies
Greatest common divisor of chip sizes
Downscaling of failures tackled by countermeasures to greatest common ...
Downscaling of failures to greatest common chip size
Assembling of devices with countermeasures
Assembling of devices
Functions to compute upper Clopper-Pearson confidence limits of early life failure probabilities and required sample sizes of burn-in studies under further available information, e.g. from other products or technologies.