Functions for Atomic Force Microscope Force-Distance Curves Analysis
Adhesion Energy
Performs a baseline correction to an AFM F-z curve
Contact point
AFM data
Detach point
Exponential decay fit
AFM experiment
Extract computed parameters from an afmexperiment
afmIndentation
Read Nanowizard JPK ascii file
Read all Nanowizard JPK ascii files in a folder
Read Bruke Nanoscope Veeco ascii file
Read all Bruke Nanoscope Veeco ascii files in a folder
afmYoungModulus
Zero Force Point and Slope
Append to an afmdata list.
Afmdata check.
Afmexperiment check.
Plot an afmdata object
Summary of an afmdata class object.
Linear fit in a running window
Set of functions for analyzing Atomic Force Microscope (AFM) force-distance curves. It allows to obtain the contact and unbinding points, perform the baseline correction, estimate the Young's modulus, fit up to two exponential decay function to a stress-relaxation / creep experiment, obtain adhesion energies. These operations can be done either over a single F-d curve or over a set of F-d curves in batch mode.