Procedures to Generate Patterns under Multistage Testing
EAP ability estimation (dichotomous and polytomous IRT models)
Standard error of EAP ability estimation (dichotomous and polytomous I...
Item bank generation (dichotomous models)
Random generation of item response patterns under dichotomous and poly...
Item bank generation (polytomous models)
Item information functions, first and second derivatives (dichotomous ...
Numerical integration by linear interpolation (for mstR internal use)
Function for weighted likelihood estimation (dichotomous a...
Module Kullback-Leibler (MKL) and posterior module Kullback-Leibler (M...
Maximum likelihood weighted module information (MLWMI) and maximum pos...
Selection of the next module in MST
Item response probabilities, first, second and third derivatives (dich...
Random generation of multistage tests (dichotomous and polytomous mode...
Standard error of ability estimation (dichotomous and polytomous model...
Selection of the first module in MST
Testing the format of the MST input lists
Ability estimation (dichotomous and polytomous models)
Generation of response patterns under dichotomous and polytomous computerized multistage testing (MST) framework. It holds various item response theory (IRT) and score-based methods to select the next module and estimate ability levels (Magis, Yan and von Davier (2017, ISBN:978-3-319-69218-0)).